christoph.neururer@unifr.ch
 +41 26 300 8925

• Rasterelektronenmikroskopie (REM), Energie Dispersive X-Ray Micro Spectrometrie (EDS), Electron   Backscattered Diffraction (EBSD), Cathodoluminescence (CL),automated Particle Analysis and sample preparation for REM.
• Focussed Ion Beam (FIB)
• x-ray Micro Computer Tomography (Micro CT) with Avizo 3D image analysis
• x-ray Fluorescence Spectroscopy (XRF)
• x-ray Powder Diffraction (XRD)
• Prototypenbau für die Forschung