Christoph Neururer


photo

 christoph.neururer@unifr.ch
 +41 26 300 8925

  • Scanning Electron Microscopy (SEM), Energie Dispersive X-Ray Micro Spectrometrie (EDS), Electron   Backscattered Diffraction (EBSD), Cathodoluminescence (CL), automated Particle Analysis and sample preparation for SEM.
  • Focussed Ion Beam (FIB)
  • x-ray Micro Computer Tomography (Micro CT)
  • 3D image analysis with Avizo software
  • x-ray Fluorescence Spectroscopy (XRF)
  • x-ray Powder Diffraction (XRD)
  • Prototype engineering for research

 

Technical Officer
Department of Geosciences

PER 07 bu. 3.311
Ch. du Musée 6
1700 Fribourg
Wednesday: morning and afternoon
PER 07, 3.311