christoph.neururer@unifr.ch
 +41 26 300 8925

• Scanning Electron Microscopy (SEM), Energie Dispersive X-Ray Micro Spectrometrie (EDS), Electron   Backscattered Diffraction (EBSD), Cathodoluminescence (CL), automated Particle Analysis and sample preparation for SEM.
• Focussed Ion Beam (FIB)
• x-ray Micro Computer Tomography (Micro CT)
• 3D image analysis with Avizo software
• x-ray Fluorescence Spectroscopy (XRF)
• x-ray Powder Diffraction (XRD)
• Prototype engineering for research