Atomic Force Microscope

Our laboratory is equipped with an NT-MDT NTEGRA AFM microscope. We use this microscope to characterize the roughness of our samples, on a typical lateral scale of microns. The vertical resolution of the instrument is under the nanometer scale. The instrument works in ambient conditions. Both contact and non-contact mode scanning can be performed. Topographic and phase images can be simultaneously acquired. Optionally, magnetic tips can be used to study magnetic properties at room temperature.

Premysl Marsik


Office PER 08 - 1.58B
+41 26 300 8918

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