Scanning tunneling microscopy and spectroscopy (STM/STS)

Scanning tunneling microscopy and spectroscopy (STM/STS)

This measurement method allows to characterize the topographic as well as the electronic properties of the surface of (semi)-conducting crystals up to atomic resolution.

The setup needs perfectly clean and flat surfaces. It works in ultra-high vacuum (10-11 mbar) and cryogenic conditions (4.5 K).

 

                                                                Setup  (STM/STS)
Baptiste Hildebrand

Assistant-e-docteur-e, Lecteur-trice

Office PER 08 - 0.52
+41 26 300 9169

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